Used KLA / TENCOR 8100 #9215494 for sale

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ID: 9215494
Vintage: 2001
CD Scanning electron microscope (SEM) 2001 vintage.
KLA / TENCOR 8100 Scanning Electron Microscope (SEM) is an advanced imaging tool used to examine a variety of specimens at high magnifications. With a nominal accelerating voltage of 1.2-30 kV and a resolution of 1.3 nm, KLA 8100 SEM enables analysis of samples down to the atomic level. TENCOR 8100 SEM comes equipped with a wide range of features and capabilities. An integrated digital imaging system provides capture of extremely high resolution images over an extremely large field of view. A sample stage is available which can accommodate a variety of microscopy needs such as stepped eucentric stages and automated stage movement capabilities. Dual detectors, including one Everhart-Thornley SE detector and one BSE/Bremsstrahlung detector, enable more detailed analyses of the surface morphology of a sample. 8100 SEM also features a range of automation capabilities including automated operational programming, automated auto-focus, and automated Bright/dark-Field beampath switching. Automated imaging routines allow for quick image captures while automated focus and brightness adjustments eliminates manual variable inputs. KLA / TENCOR 8100 SEM is compatible with a range of accessories, attachments, and detectors designed for specific microscopy applications. Available accessories include Environmental Chambers, Energy Dispersive Spectroscopy (EDS) Modules, and Liquid Argon Cryo Chambers. When used in combination with these accessories and detectors, KLA 8100 SEM can provide research insights and data into a broad range of field both qualitatively and quantitatively. With a user-friendly graphical user-interface, a versatile sample stage, and a range of automated features, TENCOR 8100 SEM is an ideal tool for capturing detailed high-resolution images of a wide range of specimen material. 8100 SEM is an essential instrument for research and industrial settings that require high-resolution imaging, materials analysis, and submicron morphology.
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