Used KLA / TENCOR 8100 #9377283 for sale

KLA / TENCOR 8100 is a scanning electron microscope (SEM) that is designed for a wide range of imaging and analysis applications, including materials characterization, failure analysis, and wafer inspection. It is capable of sub-nanometer resolution over large areas, making it an ideal tool for advanced research and industry applications. KLA 8100 is equipped with a high-resolution SE-SEM detector, providing high-contrast imaging with increased detection sensitivity and enhanced resolution. The detector also features a wide field of view and a rolling-frame scan-feature for fast scanning. This detector is coupled with a high-resolution pinhole beam for high-level imaging. The main scanning and imaging functions of the SEM are powered by a multicolor digital display system that controls a range of sample parameters, including positioning, magnification, focus, resolution, and beam energy. The SEM also provides various analytical functions, such as quantitative EDX (Energy-dispersive X-ray spectrum analysis), element mapping, image arithmetics, and backscattered electron (BSE) imaging. TENCOR 8100 has an array of sample capability settings designed to meet the requirements of different imaging and analysis tasks. It can be easily operated through a graphic user interface, which allows operators to select parameters with a few clicks of the mouse. The system also offers a wide range of automated imaging and analytical features. This SEM offers low-vacuum operation for samples that are sensitive to high-vacuum use. It also has a 3-axis auto-focus feature that ensures sharp images of samples, regardless of their height, shape, or surface texture. 8100 also has the flexibility to be used with a variety of sample chambers and holders, making it an ideal choice for a wide range of imaging and analysis applications.