Used KLA / TENCOR 8100 #9412560 for sale

ID: 9412560
Critical Dimension Scanning Electron Microscope (CD-SEM).
KLA / TENCOR 8100 is a scanning electron microscope (SEM) engineered with the latest technology, offering superior imaging and analysis capabilities. It is commonly used in research and industry settings to observe and detect features of a surface far beyond the limits of a light microscope. KLA 8100 has a digital secondary electron detector and an image acquisition equipment, enabling it to capture and record details of samples at high resolution. The high power and voltage of the microscope enables it to effectively capture images at higher magnifications (up to 500Kx). The included hardware, software and hardware integration components allow for highly precise automated procedures, and intuitive graphical user interfaces (GUI) make operation of the microscope easy and efficient. The system has a wide range of capabilities, such as thin film analysis and imaging of a wide range of materials including metals, polymers, and biological samples. Its Energy Dispersive X-ray Microanalysis accessory enables it to perform elemental characterization, surface compositional analysis and failure analysis of samples. Its Variable Pressure and Low Vacuum operation capabilities make TENCOR 8100 suitable for the analysis of samples with varied features and fragility levels. 8100 also includes particle size and shape analysis, surface topography, imaging and analysis of 3D shapes, roughness analysis, and measuring electrical resistance. Its advanced features such as particle tracking, automated focus control and pattern recognition provide researchers with even more exact measurements and data sets. Its Shock Workstation X-Ray fluorescence capabilities enable in-situ analysis and imaging of samples with no additional adjustments or manual manipulation. KLA / TENCOR 8100 is also equipped with an Autoaligning focusing mechanism and an advanced function generator, which allow for precise manual control and manipulation of the SEM's highest quality images. Its Cross-Sectional Imaging Unit is capable of capturing data used for image mapping and generation of 3D models. KLA 8100 scanning electron microscope is an all-in-one machine for precise imaging and analysis of surfaces at the highest resolutions. Its advanced imaging and analysis options, combined with its robust hardware and user-friendly software, make TENCOR 8100 an invaluable tool in research and industry.
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