Used KLA / TENCOR 8100XP #9389496 for sale

ID: 9389496
Critical Dimension Scanning Electron Microscope (CD-SEM).
KLA / TENCOR 8100XP is a widely used scanning electron microscope. It is designed to provide reliable and accurate images of surface microstructures with high spatial resolution. It is a versatile instrument that is suitable for a variety of applications in materials science. At its core, KLA 8100XP is an electron microscope. It uses an electron gun to generate electrons that are focused using electrostatic lenses into an electron beam. A sample is placed in the path of the beam and the electrons interact with the sample's atoms, generating signals which can be detected by the microscope's electronic systems. This information is then used to construct an image of the sample's surface. TENCOR 8100 XP has a number of advanced features to improve image quality and reduce analytical time. Its high resolution digital imaging system ensures images with high contrast and good depth of field. This allows for reliable and accurate surface microstructural analysis. The instrument also features an automated stage, allowing it to quickly scan large samples without any loss of resolution. KLA 8100 XP also includes advanced software features for image processing and analysis. It is capable of 3D reconstruction and data analysis from a variety of sources, such as SEM images, TEM images, and other data sets. This feature can be used to generate high-contrast images for further analysis. Because of its versatility, KLA / TENCOR 8100 XP is an ideal choice for research laboratories and analytical facilities. Using it, scientists can analyze surface microstructures with great accuracy and precision. Additionally, its advanced software features allow for fast and efficient data processing and analysis. It is an invaluable tool for any laboratory looking to take advantage of the latest in scanning electron microscope technology.
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