Used KLA / TENCOR 8100XP #9410217 for sale

KLA / TENCOR 8100XP is a scanning electron microscope (SEM) used to measure the surface morphology, composition, and electrical properties of materials. It comes with a variety of features and helpful tools that make sample analysis more reliable, efficient and repeatable. KLA 8100XP is capable of operating under high vacuum conditions, making it perfect for surface analysis, imaging, and measuring electrical properties. The SEM is also equipped with a STEM detector for energy-dispersive X-ray spectroscopy (EDS) to identify elemental composition in samples. An automated microscopy system and an inverted optical microscope help to minimize scanning times and increase accuracy. TENCOR 8100 XP also has several advanced imaging and position feedback technologies, including optical navigation for highly-defined single-point navigation, auto-focus to align the sample focus with the image, and the ability to image transparent thin film materials. 8100 XP also has an automated stepper for changing specimens and automated chamber pressure regulation for increased chamber stability. The microscope has a resolution of up to 1nm and is capable of detecting features with sub-micron accuracy. 8100XP series also offers an optional software package called ProQuant II which helps to measure surface topography, profile, and electrical parameters. KLA 8100 XP SEM is designed for a wide range of materials research, and its advanced features can provide precise and reliable results. With its superior imaging capabilities, operators can make reliable and accurate measurements of the surface features and properties of a variety of materials more quickly and cost-effectively than ever before.