Used KLA / TENCOR 8100XPR #293605761 for sale

KLA / TENCOR 8100XPR
ID: 293605761
Critical Dimension Scanning Electron Microscope (CD-SEM).
KLA / TENCOR 8100XPR is a desktop scanning electron microscope (SEM) designed for high resolution imaging and spectroscopy applications. This microscope projects an electron beam onto the surface of the sample, which causes it to emit secondary electrons, X-rays, and backscattered electrons. These emitted signals are then detected and used to construct an image of the surface. This SEM is capable of producing images at resolutions of up to 1 nm, making it suitable for analyzing nanoscale materials. KLA 8100XPR is equipped with a high energy primary electron gun, enabling the user to work with a broad range of specimen materials. This gun produces a beam of up to 1500V, which can be adjusted to a microscope point resolution of 4 nm. The gun also provides an exceptionally short exposure time and high beam current. This allows the user to capture images with low drift and at extremely high magnifications. TENCOR 8100XP-R is also equipped with a range of detectors, including a secondary electron detector, a backscattered electron detector, an X-ray detector, and a charging detector. These detectors enable the microscope to analyze samples for conductive, insulating and semi-conductive materials. The X-ray detector is especially useful for analyzing the elemental composition of the sample. KLA 8100XP-R also offers a range of automated features for imaging, such as automated stigmation and astigmatism correction, automated image capture and stitching, and automated pattern recognition to detect features in the images. The microscope also includes an integrated ChromaJet software package, which can be used to analyze and measure the color of sample surfaces. 8100XP-R is a powerful and versatile SEM ideal for material analysis and characterization. It offers high resolution imaging, high microscopy point resolution, automated imaging and feature detection, as well as a range of detectors for analyzing the elemental composition of the sample. This combination of features makes 8100XPR an excellent choice for researchers who require a desktop SEM for analyzing nanoscale materials.
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