Used KLA / TENCOR 8100XPR #293820957 for sale

ID: 293820957
Vintage: 1998
Critical Dimension Scanning Electron Microscopes (CD-SEM) DELL Computer 1998 vintage.
KLA / TENCOR 8100 is an advanced, high performance scanning electron microscope (SEM) designed for a range of scientific and industrial research applications. KLA 8100 is an advanced analytical tool that offers high resolution imaging as well as elemental, chemical, and structural analysis. TENCOR 8100 utilizes various detectors to detect various types of signals like secondary, backscatter, cathodoluminescence, electron channeling, and x-rays to capture data from the sample. To provide a high level of resolution and accuracy, 8100 is fitted with a variable-angle mini-objective lens and an optical element. This combination allows for very fine adjustments in the path of the primary electron beam and thus provides highly detailed images at the individual atom level. For elemental analysis, KLA / TENCOR 8100 is fitted with single- and multiple-energy x-ray detectors for energy-dispersive x-ray spectroscopy (EDS). This enables measurement of a wide range of elements with high accuracy and sensitivity, entirely non-destructively. KLA 8100 also features an automated sample staging system that allows users to quickly load and navigate the sample across different points of interest. This system helps to reduce user fatigue and increase productivity by reducing the amount of time needed for sample changes. TENCOR 8100 is equipped with ambient, environmental, and cryogenic stages for various types of sample preparations. The environmental stages offer liquid immersion capabilities, allowing for the observation of submerged samples. The cryogenic stages allow for imaging of highly volatile samples in extreme temperatures. 8100 is also fitted with a wide range of imaging software that allows users to easily manipulate captured images, manipulate color and contrast, and save analysis results to share with colleagues. KLA / TENCOR 8100 is a versatile high performance scanning electron microscope that has become invaluable in many research and industrial applications. It is capable of providing extremely detailed images and sophisticated analyses of samples, and its numerous features enable it to tackle a range of different applications.
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