Used KLA / TENCOR ECD-2 #9269028 for sale

KLA / TENCOR ECD-2 is a high resolution scanning electron microscope (SEM) that provides industry-leading performance for semiconductor manufacturers and research laboratories. It is designed to provide high resolution imaging with excellent throughput and low noise. KLA ECD2 uses a spherical column design that is extremely stable and precise over a wide temperature range. This makes the SEM ideal for ultra-high resolution imaging. The advanced secondary electron imaging and x-ray spectrometry systems allow the user to visualize and analyze features with high precision. Additionally, the automated stage enables the user to quickly move between imaging areas. TENCOR ECD 2 incorporates advanced collision-induced dissociation capabilities for higher accuracy and resolution of low Atomic Number materials. This allows analysis of gallium arsenide (GaAs) and other semiconductor compounds with higher resolution. This is essential for advanced semiconductor manufacturing processes. KLA / TENCOR ECD 2 has an automated sidewall inspection feature that is able to detect line widths as small as 1 nanometer. This makes the SEM an essential tool for analyzing current semiconductor technology. Additionally, the micro-scale material analysis feature facilitates faster, cost-effective evaluation of process technologies. KLA ECD-2's combined electron-optical capabilities make it a reliable and powerful imaging system. The digital signal processing system boosts the resolution of imaging data. This allows TENCOR ECD-2 to capture high-resolution images faster than ever before. KLA / TENCOR ECD2 has a user-friendly interface that allows for easy operation. The vacuum system is built to provide the required environment for the correct operation of the SEM. Additionally, KLA ECD 2 is equipped with air pumps and humidity control systems to ensure the best image quality. In conclusion, ECD2 is a high resolution SEM that provides industry-leading performance for semiconductor manufacturers and research laboratories. Its advanced secondary electron imaging and x-ray spectrometry systems enable the user to accurately analyze features, while its automated sidewall inspection feature allows for analysis of current semiconductor technology. Additionally, its user-friendly interface and built in temperature, vacuum, and humidity control systems make it the ideal imaging tool.