Used KLA / TENCOR EMMI 1630 #9404528 for sale

KLA / TENCOR EMMI 1630 is a scanning electron microscope (SEM) that offers high resolution imaging capabilities for a wide range of materials and applications. This SEM is designed for both basic and advanced research activities such as imaging and characterizing surfaces, materials and nanoscale structures. KLA EMMI 1630 offers an impressive range of features such as a 0.9nm resolution, a lateral resolution of up to 3.2nm, and a vertical resolution of up to 100nm. By using a special gun module with a unique double-collector, this SEM produces high contrast images with great detail. It is also equipped with imaging automation which enables users to produce data faster and with more accuracy. TENCOR EMMI 1630 is outfitted with advanced imaging techniques such as 3D imaging in a single-shot, element detection and sediment analysis. The SEM is capable of analyzing both non-conducting material and electrical samples. Its wide range of analysis capability makes it ideal for inspecting and analyzing a variety of materials such as materials used in electronics, biomedical samples, and engineering plastics. This SEM can also be used for failure analysis or for industrial non-destructive testing. It offers high accuracy measurement capability, such as detection of submicron particle size, measurement of defects and voids, and contour analysis of various surface systems. EMMI 1630's sample preparation techniques include optical metrology, preparation of film surfaces and cross-sections, ultrasonic cleaning, cleaning of sample surfaces and chemical treatment. The SEM also offers multiple user operation modes such as low vacuum, ultra-low vacuum, minor conductive and major conductive. KLA / TENCOR EMMI 1630 is designed for ease-of-use and simple operation. The instrument's sealed chamber offers optimum protection from contamination, and its intuitive graphical user control interface offers user-friendly access to its features and functions. All in all, KLA EMMI 1630 is a powerful scanning electron microscope that is designed to provide high resolution imaging capabilities for many applications. Its wide range of analysis capabilities, automated operation and intuitive user interface makes it an ideal tool for researchers and engineers.