Used KLA / TENCOR EV200 #9223844 for sale

KLA / TENCOR EV200 is a scanning electron microscope (SEM) that is used in research into materials analysis. It is designed to provide a highly detailed, three-dimensional image of the specimen, and its features enable users to obtain a variety of data from specimens. The advanced technology of KLA EV200 enables accurate operation at a wide variety of primary and secondary microscope magnifications up to 120,000x. This allows users to observe extremely small features, such as individual atoms, with high clarity. Moreover, the microscope is equipped having a field-emission gun (FEG) that delivers high levels of stability and uniformity during imaging. This FEG produces a beam of electrons that can be focused onto the sample, which is then scanned and an image is formed. In addition, TENCOR EV200 features a large chamber, allowing samples to have a variety of geometries. This includes scanning of low-contrast and wide-area specimens such as coatings, films and organic materials. Furthermore, the chamber is designed to hold a specimen in an environment of low mechanical vibrations and humidity, while enabling analysis with variable pressure. EV200 also has an integrated Image Analysis Software Suite that enables users to analyze specimens at high speeds using automated tools. This includes features such as automated feature detection, multi-layer classification, and 3D modeling capabilities. Moreover, this software is designed to enable precise analysis of images by making minor modifications. Moreover, KLA / TENCOR EV200 has a number of integrated detectors, which enable the user to capture data from several different angles. The first is the Secondary Electron Detector (SE), which produces a high-resolution image that can be used to evaluate surface topology and microstructures. In addition, the Signal Electron Detector (BSE) is determined by electron backscatter, providing valuable data on composition, thickness, grain, and texture. Last but not least, the Fast Electron Detector (FE-SEM) is used to capture electron signals from objects with high speed and resolution. In conclusion, KLA EV200 is an advanced scanning electron microscope (SEM) that is designed to provide a quick, efficient, and detailed image of microscopic samples. Its powerful features and integrated detectors allow researchers to gain highly precise data, while the integrated image analysis software suite enables rapid analysis of samples.