Used LEICA / CAMBRIDGE / LEO Stereoscan 200 #9280971 for sale

LEICA / CAMBRIDGE / LEO Stereoscan 200 is a scanning electron microscope (SEM) designed primarily for imaging materials at the nanoscale and beyond. The microscope offers both a high level of resolution and flexibility, allowing a wide range of experimental parameters to be controlled. At the heart of LEO Stereoscan 200 is its powerful electron column. This column produces a highly focused electron beam, generated from its thermionic source with the aid of electrons generated from a semiconductor filament. This beam of electrons is accelerated towards the specimen and is then focused and scanned across the sample. The microscope has an integrated high performance SE detector allowing for high resolution imaging in bright and dark field SEMs. The detector collects secondary electrons emitted from within the sample material which can then be converted into images. Side-detected backscattered electrons can enable phase mapping which provides excellent contrast between different materials. It also has an optional energy dispersive X-ray spectrometer for analysis of elemental composition and imaging in the SEM. LEICA Stereoscan 200 also features advanced software, such as Auto Stage and automatic focus, giving users the ability to use easy-to-control environments. The user-friendly interface allows precise adjustment of magnification parameters and other SEM controls for high resolution imaging. Stereoscan 200 has an adjustable working distance from a minimum of 45mm and a variable spot size of less than 1 nm. This ensures the capability of producing ultra-high-resolution images enabling the study of small features such as nanoscale structures and surfaces. The microscope has a large sample size range of up to 200mm in diameter and is compatible with adapters for corrosion or preparation prior to imaging. It has a tilted-stage capability to manipulate the sample angle and it also has a wide range of accessories. CAMBRIDGE Stereoscan 200 is an ideal tool for nanoscale imaging, phase mapping, and EDX analysis, making it suitable for many different kinds of materials research.