Used LEO 430 #185415 for sale

LEO 430 scanning electron microscope (SEM) is a powerful device used for in-depth analysis of the microscopic structure of various organic and inorganic materials. It produces high-resolution images with a magnification range of up to 10,000x and a working distance of between 0.5-10mm. 430 SEM is equipped with an everhart-thornley type detector, which provides quick and reliable results. It is able to detect the sample's topography, composition, visual morphology, and sample size. LEO 430 SEM works on the principle of secondary electron image detection. This principle is based on the scanning of a thin, focused beam of fast electrons across the sample surface, which in turn causes the emission of secondary electrons from the sample surface. These secondary electrons are then detected by the everhart-thornley type detector which produces an image of the surface in great detail. The resolution of the images produced by 430 are significantly higher than those obtained by other microscopy means. LEO 430 is also equipped with a high-vacuum system, which is necessary for operation at very high magnifications. This system is capable of reaching a pressure of 2 x 10e-7 Torr. This ensures that the beam is able to penetrate the sample surface with minimal distortion and hence produces high-resolution images. In addition, the vacuum system also offers a level of dust and particle protection while keeping maintenance required to a minimum. 430 is equipped with a vacuum-coated, single tilt sample holder which offers a wide angle view of the specimen allowing for the viewing of different facets of the sample surface. This is further enhanced due to the SEM's ability to tilt the sample holder over a wide range of up to 60 degrees. The sample holder is also equipped with an X and Y sample translation stage which offers a precise positioning ability to capture the various features on the sample surface in detail. LEO 430 provides a powerful and flexible tool for analyzing the surface microstructure of organic and inorganic materials. Its integrated components and features make it one of the most versatile SEMs available in the market for study of microstructures and topographical features.