Used LEO 435VP #185414 for sale
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ID: 185414
Scanning electron microscope, (SEM)
Resolution: 4 nm
5 axis computer controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190 mm.
LEO 435VP is a high-end scanning electron microscope (SEM) produced by Zeiss. It is capable of magnifications up to 500,000x and has a built-in energy dispersive spectroscopy (EDS) system for elemental analysis. This helps to provide further information about the physical structure of a specimen. LEO 435 VP has a dynaFEG source, which is the latest advancement in electron gun technology. This improves the brightness and stability of the electron beam, which allows for higher resolution images and spectroscopic data. It is capable of acquiring secondary electron images or backscattered electron images at resolutions of less than 10 nm. This SEM has also has a high-intensity X-ray generator. It is able to detect elements with a minimum composition of 0.2% for standard analyses. The inclusion of both an EDS system and an X-ray generator make this an ideal tool for analyzing geological and biological samples. To improve operator usability, 435VP has a streamlined user interface with a comprehensive suite of functions. It has multiple settings for altering the image resolution and particle flux. This makes it easier to fine tune the SEM for the sample being analyzed. Furthermore, 435 VP also has advanced automation capabilities. This allows the same program to be repeated multiple times with minimal operator input. It also has an integrated analysis system that can automatically detect and identify particles within the sample. Overall, LEO 435VP is an excellent choice when it comes to scanning electron microscopes. Its advanced electron gun and X-ray generator produce detailed images and spectroscopic data. It also has multiple automated settings and an intuitive user interface. This helps to reduce operator time and improve the accuracy of experiments.
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