Used LEO 438 VP #293632311 for sale

LEO 438 VP is a variable pressure scanning electron microscope (VP-SEM) that offers an unmatched combination of versatile performance and affordability. It is the perfect tool for a wide range of materials and applications, including semiconductors, metallurgy, life science, polymer film, electronics and industrial parts. The base model of 438 VP is equipped with an integrated system of cold field emission scanning electron microscope (FESEM) and field emission transmission electron microscope (TEM). The dual beam combination of SEM/TEM provides for high-resolution, high-contrast imaging of samples down to an impressive resolution of 1,200nm. The SEM/TEM system is powered by a dual-stage high-tension generator, enabling both SEM and TEM imaging in a range of 5kV to 40kV. LEO 438 VP is also capable of variable pressure imaging between 0.01 - 10 Torr. This feature allows for optimizing imaging conditions, improved material contrast and surface resolution, and increased overall efficiency in sample preparation and imaging. The FESEM is equipped with a large-format solid-state segmented detector that allows for higher transmission and image quality across the entire field of view. The EDS and EBSD detectors provide excellent results for elemental analysis and crystal structure of samples, while the in-lens SEM detector allows for higher magnification imaging (up to 30Kx), making it ideal for a wide range of user applications. 438 VP also comes with a comprehensive software suite for full sample control and automated imaging. This includes a large database of crystal structures for quick identification of materials, automated image processing with a suite of image analysis and enhancement algorithms, and sample preparation and coating with automated instruments. LEO 438 VP is the perfect tool for both educational and industrial sample inspections and analysis.