Used LEO / ZEISS 1430VP #9259807 for sale

LEO / ZEISS 1430VP is a scanning electron microscope (SEM) especially designed for imaging and analysis of small three-dimensional samples. It offers extremely high resolution capabilities in both imaging and analytical measurements. It is suited for detailed analysis of both organic and inorganic materials in both low-vacuum and high-vacuum imaging chamber. The electron gun of LEO 1430VP uses a field emission gun which produces an electron beam with a high energy resolution. This gun also produces a low beam astigmatism making it ideal for imaging and small area experiments. The gun can be operated in either a low voltage mode for imaging and observations, or in a high voltage mode for analyses, such as energy dispersive X-Ray spectroscopy (EDX), wavelength dispersive X-Ray spectroscopy (WDS). ZEISS 1430VP is also equipped with a carbon filament for in situ/temperature stage, allowing observation and analysis of material properties at elevated temperatures. 1430VP offers a variety of imaging modes, which can include secondary electron imaging (SEI), backscattered electron imaging (BSE), and scanning transmission electron microscopy (STEM). The backscattered electron images are collected in either an inclined angle or nominally normal to the sample plane. SEI imaging can be further optimized using the stage tilt function. The sample is raster scanned using a high speed sample stage, while real time imaging enables users to track changes in sample properties. LEO / ZEISS 1430VP is also equipped with a range of detectors for elemental analysis, including EDX, WDS, and energy filtered transmission electron microscopy (EFTEM). EDX is used to detect elements in a sample with a sensitivity from trace levels up to several mass %. WDS is used to detect light elements with a sensitivity of a few ppm. EFTEM is ideal for observing very fine structural or compositional details present within a sample. The analytical capabilities of LEO 1430VP can be extended by using a range of software packages. These include ZEISS 1430VP Visualization Tools, 1430VP Data Analysis Software, LEO / ZEISS 1430VP Image Analysis and 3D Reconstruction Software. All of these software packages are designed to optimize the data collection, processing, and analysis of the SEM images. Overall, LEO 1430VP is an advanced, high-performance scanning electron microscope, ideal for imaging and analysis of three-dimensional samples. Its advanced optics, imaging modes, and analytical detectors provide outstanding resolution, while its automated software packages optimize the data collection and processing for excellent results.