Used LEO / ZEISS 1440VP #9255473 for sale

LEO / ZEISS 1440VP Scanning Electron Microscope (SEM) is a cutting-edge microscopy tool for atomic-level imaging. Its advanced capabilities enable high resolution imaging through its low-voltage electron beam. This makes it well-suited for sensitive applications that require extremely high resolution imaging, such as failure analysis of micro-electronic components. LEO 1440VP SEM is available in both 1kV and 5kV varieties and enables maximum resolution images of 2nm. It also features an in-lens detector design, which enables high speed imaging with low noise. This design also provides an exceptionally wide field of view, enabling the imaging of large samples with minimal distortion. Additionally, the microscope comes equipped with a transmissiometer for automated alignment of the electron beam to the sample or backscatter detector. Other features of ZEISS 1440VP Scanning Electron Microscope include a high speed imaging mode, which allows users to view and analyze images in an accelerated manner. This feature also makes it possible to capture multiple images with very short exposures while maintaining great resolution. The microscope also supports a wide range of detectors, allowing it to capture various imaging modes, such as energy-filtered imaging and elemental distribution mapping. 1440VP Scanning Electron Microscope is a powerful imaging tool capable of producing high resolution images with exceptional sensitivity. Its wide range of features make it suitable for a variety of applications, such as failure analysis, element distribution mapping, and analyzing the microstructure of delicate materials and components. This advanced and robust SEM makes the analysis of complex microstructures possible, and is a great choice for scientists and engineers working in fields such as electronics, materials science, and nanotechnology.