Used LEO / ZEISS 1450EP #9284365 for sale

ID: 9284365
Scanning Electron Microscope (SEM) Hard Disk Drive (HDD) removed.
LEO / ZEISS 1450EP is a scanning electron microscope (SEM) that provides high-resolution imaging of samples for materials science, biological, and medical applications. The instrument uses an electrostatic column to produce an electron beam that is focused on the sample surface. The electrons interact with the sample to produce secondary electrons, backscattered electrons, and X-rays. These signals can be detected to create either two-dimensional low or medium-resolution images, or three-dimensional high resolution images. LEO 1450EP features LEO 'In-lens' electron optics, employing state-of-the-art detection and imaging technology, a highly efficient energy filter, and an in-lens magnetic lens. The in-lens design reduces aberration and increases resolving power. In-lens imaging reduces the space required for the entire assembly, while a 'Light Field' Collector further minimises the size of the high voltage electron gun. ZEISS 1450EP is equipped with an integrated imaging system, an Optics Module and a digital image processor, which together allow for a wide variety of image contrast optimization and display capabilities. The Optics Module includes a Contrast Reduction Filter, an Extra High Voltage Detector and an Electron Beam Profiler, for more precise contrast-controlled scanning. The digital image processor is capable of acquiring a wide range of images including BSE, SE, EBSD and CL images. 1450EP has a maximum scan field of 20mm and a minimum scan area of 0.006mm. The voltage range of the electron optics is 0.5 to 30kV. The instrument is equipped with an automated specimen stage (X, Y, R, T) and the sample can be manipulated accurately to center it on the electron beam. Automated alignments are possible with the supplied 'Smart Alignment' software, providing exceptional accuracy for complex sample manipulation. LEO / ZEISS 1450EP has a small footprint, requiring less floor space than traditional SEMs, and is an ideal tool for research and development applications. Its intuitive controls provide users with the ability to quickly obtain high-resolution images, and the automated specimen manipulator enables precise sample alignment with scanning and imaging capabilities. LEO 1450EP is the perfect solution for a wide range of imaging and materials analysis applications.
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