Used LEO / ZEISS 1450VP #293660400 for sale

LEO / ZEISS 1450VP Scanning Electron Microscope (SEM) is a high performance equipment designed for comprehensive sample analysis. It boasts a high resolution imaging and analytical system with improved precision and versatility compared to previous generations of SEMs. LEO 1450VP's specimen chamber is designed to hold specimens up to 8 cm in diameter. It is capable of conducting non-destructive depth profiling, as well as secondary and/or backscattered electron imaging. ZEISS 1450VP's column is equipped with an ultra reliable X-Line field emission gun (FEG) with a lifetime of over 20,000 hours. This high-quality source ensures 1450VP produces excellent secondary electron images, regardless of whether the surface is smooth or rough. It has adjustable operating parameters to tune the electron intensity as required. LEO / ZEISS 1450VP features a rotating tilt/rotate specimen stage with an integrated vertical lift stage. The inclinable stage makes for easier sampling, while the vertical lift increases the flexibility and range of the microscope's operation. Additional accessories such as an Edmund Optics 3D optical superresolution unit and a secondary electron detector help improve the precision and accuracy of imaging experiments. LEO 1450VP also has a wide range of analysis capabilities, including elemental analysis, phase analysis, and crystallographic analysis. Its Energy Dispersive X-Ray Spectroscopy (EDX) machine allows for both detection and quantification of elements and phases in a sample. It comes with a GADDS diffractometer to analyze crystalline structure on the sample. ZEISS 1450VP also has a high-precision displacement sensor that detects sample movements as small as 0.1 nanometer. 1450VP has a variety of software options that make it even easier to use. Its Eagle software suite includes a point-and-click GUI interface, a library of SEM imaging recipes, and advanced analytical tools. Its Smart Workflows feature allows users to quickly and easily aim the FEG beam for optimum imaging or analysis. Usability is also a major factor in LEO / ZEISS 1450VP's design. It features essential functions such as a video camera, foot switch controls, and vacuum control panel. LEO 1450VP is also equipped with a failsafe mechanism for the electron beam that ensures the safety of operators and specimens. Equipped with its robust design, wide range of features, and intuitive software, ZEISS 1450VP Scanning Electron Microscope is perfect for researchers looking to conduct advanced analysis for materials research. Highly flexible and versatile, it provides the perfect platform for a variety of sample exploration and analysis needs.