Used LEO / ZEISS 1450VP #293755515 for sale

LEO / ZEISS 1450VP Scanning Electron Microscope (SEM) is a powerful instrument for observing and analyzing the surface of a material down to the nanometer level, allowing for high resolution imaging and topographical analysis. It comprises two main major components, the electron column and the detection equipment. The electron gun is composed of an achromatic condenser lens, condenser aperture, objective lenses, and a diffraction grating for generating secondary electrons. An electrostatic column is also includes an electrostatic shift, and an absorption specimen chamber. The detection system is connected to the column and is composed of a hemispherical electron detector, which enables the measurement of energy, angular spread, and back scattering of electrons. The accelerating voltage of LEO 1450VP SEM is variable, from 1 kV to 30 kV, and the current is up to 300 μA, allowing high resolution imaging and analysis as well as a wide range of observations. The microscope allows for a wide range of imaging modes, including variable pressure (VP) mode for liquid samples, variable pressure (VPS) mode for gases, and variable pressure scanning electron microscopy (VP-SEM) mode, which offers the highest resolution. ZEISS 1450VP SEM is equipped with an automated stage, which allows sample positioning with the greatest of precision. This unit automatically controls sample movement according to user-defined parameters, such as driving speed, direction, and position. The microscope also features an automated tilt, which allows for the adjustment of sample positioning both vertically and horizontally up to around 90°. The data acquisition machine of 1450VP SEM includes two imaging modes. The first is a single point mode, which allows for the capture of a single image of an entire field of view. The second mode is a multiple point mode which allows the user to capture multiple images of a single field of view. Furthermore, the tool is designed to easily output digital data in formats such as JPEG, TIFF, and BMP image files. LEO / ZEISS 1450VP SEM allows users to capture data with the utmost accuracy and precision, as well as providing a range of other useful functions such as automated image stitching and montages. This makes the SEM an extremely useful tool for researchers looking to observe and analyze samples at nanometer levels, and is well suited for applications in material science, biology, and geology.