Used LEO / ZEISS 1450VP #9230342 for sale

LEO / ZEISS 1450VP is a scanning electron microscope (SEM) of the highest possible resolution, used to generate extremely detailed images of surfaces from a variety of materials. It employs a unique combination of powerful SEM features to provide a wide range of analytical capabilities to explore specimen surface areas. Its features include the innovative high-resolution imaging system which provides outstanding image quality and enables precise imaging of specimen components. Its field emission source produces extremely low electron scatter, allowing users to maximize specimen contrast. With a ranging apertures, high-resolution imaging remains available, even for fragile specimens. LEO 1450VP also offers a number of advanced manipulation functions, including automated X-Y alignment, image stitching, scanning stage movement and software control over magnification. This allows the user to capture data sets comprising many overlapping images from the same sample, providing a complete picture of the specimen. ZEISS 1450VP also incorporates an array of analytical hardware and software. This includes energy-dispersive X-ray spectroscopy (EDS) and electron spectroscopy for chemical analysis (ESCA). The X-Ray EDS can measure the composition of specimens on the nano-scale, while the ESCA analysis is used to obtain high-resolution information about surface chemistry with an accuracy down to the atomic level. The potential of 1450VP to provide valuable data is supported by a maximum resolution of 0.7nm, an acceleration voltage of up to 30kV and electron beam focusing of 0.2-4nm. The machine also utilizes a semi-focal point style filament, a BSE detector, chillers, an autocentering function and a potential for automated operation. This enables a full range of specimen inspection and analysis, from general microscopic materials characterization to imaging and describing extremely large and complex samples. A wide range of analytical techniques are also available, such as Secondary Electron Imaging, X-Ray Mapping, Phase Contrast Imaging, Digital Image Processing, Static and Dynamic Image Enhancement, and Multi-Axis Analysis. Overall, LEO / ZEISS 1450VP provides an excellent means for examination of materials, surfaces and components for a wide range of applications in the fields of science and engineering. Its sophisticated features, combined with high accuracy and resolution, make this SEM an outstanding choice for many specimen studies.