Used LEO / ZEISS 1455 #293679343 for sale

LEO / ZEISS 1455 scanning electron microscope (SEM) is an analytical instrument used in a variety of scientific fields for obtaining high resolution images of a sample's surface. It is equipped with an advanced, effective performance column, energy dispersive X-ray detector, and vacuum system, allowing a range of advanced imaging capabilities. LEO 1455 SEM uses a focused beam of high-energy electrons to 'scan' the surface of a sample. A unique and very powerful feature of this instrument is the ability to correct aberration, a distortion in the imaging caused by corrosion or chemical damage. This allows the electron beam to accurately scan areas of the sample that are difficult to reach without detriment to the imaging quality. The energy of the electrons is adjustable, allowing for detailed imaging of different materials on a sample as well as imaging of less transparent objects. ZEISS 1455 also comes with a built-in automated stigameter, which provides high resolution mapping of the topography of a sample. 1455 is equipped with a special energy dispersive X-ray (EDX) detector, an important component that measures the energy-dispersed X-rays emitted from the sample as it is scanned. This detector is used to build up an elemental map of the sample, which can provide an analysis of the composition of the sample at a very high resolution. LEO / ZEISS 1455 is also equipped with a high vacuum system. A powerful booster pump is included, ensuring the best possible vacuum performance and allowing for a wide variety of imaging surfaces and depths to be imaged without loss of quality or resolution. LEO 1455 is a powerful scanning electron microscope for applications in materials science, nanotechnology, chemical analysis, and more. Its advanced imaging capabilities, coupled with its advanced aberration corrector, EDX detector, and reliable vacuum system, make it an excellent choice for researchers and scientists looking to acquire high-resolution images and elemental composition of a sample.