Used LEO / ZEISS 1455VP #293764385 for sale

LEO / ZEISS 1455VP Scanning Electron Microscope (SEM) is a powerful electron optical instrument used to magnify materials from a few nanometers up to a few millimeters. LEO 1455VP is built for performance, providing a variety of analytical capabilities such as elemental analysis and nanometer-scale imaging. ZEISS 1455VP has a field emission gun (FEG) and a high probe current providing a high performance imaging equipment with a resolution down to 1 nanometer. The SEM also offers three beam currents: low, semi-high, and high. The low beam current provides a low beam current to the system, while the high beam current allows for capture of the highest resolution images. The instrument is well equipped with a variety of specimen holders and stages, allowing for a range of samples to be studied. In addition, 1455VP has a cryo-preparation unit integrated with the SEM, allowing for samples to be imaged at liquid nitrogen temperatures (LN2) for cryo-electron microscopy (SEM). LEO / ZEISS 1455VP is equipped with a variety of detectors that make it suitable for different applications, such as energy dispersive x-ray spectroscopy (EDS), secondary electron imaging (SEI), backscatter electron imaging (BSEI), and x-ray mapping. The machine also offers a fine auto-focus feature for providing high resolution imaging. Overall, LEO 1455VP is a state-of-the-art tool for imaging nanoscale structures, performing elemental analysis, and generating nanometer-scale characterization images. Its FEG electron source enables the user to access a high probe current at different beam currents to gain access to higher resolution images. The combination of its various detectors and its cryo-preparation tool makes it suitable for a wide range of applications.