Used LEO / ZEISS 1455VP #293777704 for sale

LEO / ZEISS 1455VP is a scanning electron microscope (SEM) designed for routine and research imaging of surface morphology and particle analysis. It is fitted with an everhart-thornley (ET) detector allowing for high resolution imaging of non-conducting surfaces and a channeltron electron detector for high-speed secondary electron imaging. This SEM also has an in-lens low vacuum equipment for imaging insulating materials, and an extra high voltage source of up to 30 kV for greater depth of field. LEO 1455VP utilizes field emission scanning electron microscopy (FE-SEM), which produces an increased current per unit area than other SEM systems, allowing for excellent imaging resolution. The FE-SEM system uses a gun filament to generate electrons with higher energy than thermionic guns and is able to provide a smaller, more focused probe for the best achievable resolution. This microscope is equipped with a ultra-high resolution Everhart-Thornley (ET) detector, allowing for maximum resolution of the sample surface and accurate particle sizes to be detected. ZEISS 1455VP also comes with an automated visual access unit providing precise sample scan positioning and stage control. It contains an automated image capture machine, allowing for easy storage of data and reliable image selection. The microscope is capable of producing both still and moveable digital images. 1455VP is suitable for many different types of imaging, including three-dimensional surface imaging (3D FIB-SEM), gain and contrast control imaging (ACE), and the generation of x-ray microanalysis data (EDX). It also has a low vacuum tool allowing for ease of imaging on non-conductive surfaces with minimal scattering. LEO / ZEISS 1455VP is an essential piece of scientific imaging equipment for sample analysis in industrial, academic and medical research. It can provide highly detailed images of particles and surface features allowing researchers to identify features which may be hidden by conventional microscopy. The high resolution imaging and ease of sample preparation make this a popular choice for researchers in need of high-end SEM capability.