Used LEO / ZEISS 1455VP #9089413 for sale

LEO / ZEISS 1455VP Scanning Electron Microscope (SEM) is a versatile and powerful digital imaging tool designed for a variety of research and industrial applications. LEO 1455VP delivers superior resolution and analysis capabilities, enabling researchers to obtain higher quality images, acquire reliable measurements, and obtain insights into the sub-microscopic world with greater accuracy and reliability. This SEM has a standard dual lens, dual view operation enabling simultaneous imaging of specimen surfaces and subsurface areas in both high and low vacuum modes. Its 15KV accelerating voltage enables the transmission of high quality electrons to create a high resolution scan of the sample's surface at a magnified scale that is not achievable with light microscopes. ZEISS 1455VP also has a large sample chamber to fit a variety of samples, and an integrated EDS detector for elemental analysis. State of the art multi-channel detectors are available to further enhance the resolution of the acquired images. 1455VP has an intuitive user interface and a large touchscreen display for greater control of parameters and image analysis. This SEM has a 3-axis stage for automatic sample scanning and positioning, allowing for precise sample adjustment and motion. Furthermore, LEO / ZEISS 1455VP has a specialized low-voltage imaging mode for imaging non-conductive samples without charging effects. The new LEO 1455VP provides custom built software designed for a variety of applications like nanometer scale imaging, defect analysis, surface characterization and metrology, material analysis, and failure analysis. This SEM offers a wide range of additional features, including a tilt stage for adjustable specimen angle, a thin film insert for high contrast imaging, and a 10:1 reduction lens for larger sample capture and magnified images. Additionally, for applications requiring ESD (Electron Microscope Diffraction) ZEISS 1455VP is equipped with an integrated ESD system and a full kit of accessories. A unique feature of 1455VP is LEO M-View mode which allows the user to observe how images in fluorescence, scanning and transmission electron microscopy compare, creating comprehensive studies. Overall LEO / ZEISS 1455VP SEM is a powerful tool capable of delivering higher resolution, reliability, and accuracy and providing users with the ultimate in scanning electron microscope performance.