Used LEO / ZEISS 1455VP #9285391 for sale

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ID: 9285391
Vintage: 2002
Variable Pressure Scanning Electron Microscope (VP-SEM) Source type: Tungsten Motorized X, Y, Z stage type With removable block Detectors: BSD BSE Operating system: Windows XP Power supply: 208-240 V, 50/60 Hz 2002 vintage.
LEO / ZEISS 1455VP is a scanning electron microscope (SEM) designed for high resolution imaging and analytical needs. It is one of the most flexible and versatile SEMs on the market, offering a wide range of features and functions with optimized performance for both materials and life sciences applications. LEO 1455VP offers a wide range of electron optical configurations for imaging and analytical needs. The high-resolution optics provide up to 5nm resolution for smaller specimens, while the large-area and flexible imaging modes allow for imaging of larger structures. The electron source can provide up to 30kV and 350kW of power, allowing for high resolutions, high magnifications, and fast scanning dynamics. ZEISS 1455VP SEM also features a number of advanced analytical capabilities, including energy-dispersive x-ray spectroscopy (EDS), Energy Filtering Transmission Electron Microscopy (EFTEM), and electron backscatter diffraction (EBSD). The EDS capabilities allow for elemental analysis, while the EFTEM is optimized for elemental mapping of thicker specimens. EBSD provides enhanced analysis of crystalline structure in a range of organic and inorganic materials. 1455VP SEM has a number of built-in safety features, including a high-stage collision control system, a low vacuum optical chamber monitor, and a septum/shutter combination unit. This allows for safe and accurate operation. The user-friendly design of the SEM make it easy to use, and its intuitive user interface allows for quick and easy operation. LEO / ZEISS 1455VP scanning electron microscope is an advanced and versatile instrument capable of providing high resolution imaging, quantitative analysis, and a wide range of analytical capabilities. From life science applications to materials characterization, LEO 1455VP can meet the needs of any researcher. Its range of advanced features, robust design, and excellent performance make it an ideal choice for any electron microscopy application.
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