Used LEO / ZEISS 1455VP #9309328 for sale
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ID: 9309328
Vintage: 2000
Scanning Electron Microscope (SEM)
With RAITH E-Beam nanolithography system
Capable of writing sub 100 nm
With up to 16-bit resolution
Tungsten filament
Operating system: Windows XP
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Fully motorized stage
No interferometer
Tilt to ~180°
Operating system: Windows XP
Detectors:
Everhart-Thornley secondary electron detector
(4) Quadrant backscatter detectors
LaB6 Filament
Voltage: 30 kV
2000 vintage.
LEO / ZEISS 1455VP is a scanning electron microscope (SEM) that combines speed and accuracy in the high-resolution imaging of biological specimens. Using the latest electron optics technology, it provides an innovative imaging platform to analyze morphology, cellular structures, and micro-particles as small as 5 nanometers with up to several hundred million pixels. At the core of LEO 1455VP is a fully-coated, dedicated vacuum-column that ensures consistent imaging performance over long hours of use. The SEM's sophisticated design features a unique curved mirror optical equipment which enables faster scan speeds with minimal coma and astigmatism distortion. With further optimizations such as a variable primary and secondary electron beam deceleration, this system delivers image resolution and contrast of the highest quality. ZEISS 1455VP stands out for its advanced imaging capabilities. Its stereo detachable stage allows investigators to capture 3D images in either a bright or dark field mode, as well as varying the angle of observation for unique visual perspectives. It also features an Orbotech BSE real-time imaging unit which enables contrast adjustments, image segmentation, and focus refinement in situations where the signal-to-noise ratio is particularly low. The instrument's ease of operation is further complemented by its user-friendly interface. Designed with the latest touchscreen technology, the integrated touchscreen display simplifies the navigation of the menus, allowing operators to quickly and easily select specimen and imaging parameters. Finally, 1455VP incorporates a high-tech data acquisition and analysis machine. It is equipped with an image-based, spectral analysis package which uses advanced deconvolution algorithms to accurately measure area, shape, and particle size distribution for nanocharacterization studies. Overall, LEO / ZEISS 1455VP is a powerful scanning electron microscope that sets a new standard for imaging performance and flexibility. Its comprehensive range of features, ergonomic design, and advanced data acquisition and analysis tool make it a reliable instrument for a wide range of applications in biological research.
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