Used LEO / ZEISS 1525 #9397456 for sale

LEO / ZEISS 1525 is a scanning electron microscope (SEM) designed with an extraordinarily high level of accuracy and resolution. This model offers the highest resolution of any SEM in the world, allowing for unparalleled imaging and analysis of many sample types. LEO 1525 uses both single- and scanning-beam detectors for a wide range of analysis. The equipment's secondary electron detector produces high-contrast, monochrome images suitable for morphologic, textural, elemental, and trace contaminant analysis, while the system's backscattered electron detector offers versatility for measuring specimen topography and surface features. This model also features a high-resolution electron micrograph mode, allowing for the production of high-resolution images from a broad range of samples. ZEISS 1525 is designed with a number of advanced features, including an X-Y tilt capability, an adjustable chamber, and the ability to image at variable or fixed temperatures. Additionally, its adjustable chamber provides humidity control, allowing for critical sample preparation and analysis. 1525 is capable of producing multi-elemental mapping images with a single scan, as well as quantitative X-ray microanalysis (EDX/EDS) images, with resolutions as low as 10 nanometers. These enable detail material characterization and trace element imaging. In addition, EBSD (electron backscatter diffraction) can be used to determine crystal structure, grain orientation and purity. In a stand-alone configuration, LEO / ZEISS 1525 can be used for operations under vacuum and a range of imaging and analysis modes. And the unit's versatility is further enhanced by its expandability, enabling users to configure it for use in a variety of imaging and analysis applications. With its high resolution and advanced features, LEO 1525 is an ideal choice for scanning electron microscope applications. This machine's accuracy, versatility, and expandability allow for high-resolution imaging and analysis of a vast array of sample types.