Used LEO / ZEISS 1530 #293624721 for sale

LEO / ZEISS 1530 Scanning Electron Microscope (SEM) is a powerful piece of imaging equipment used by scientists and research institutions to observe and analyze the microstructure of materials. It produces high-resolution images of the surface of samples with dimensions as small as 0. LEO 1530 SEM is a tabletop instrument that can be used to identify features as small as less than a nanometer (nm). It incorporates a Schottky Field Emission Source (FE-SEM) that enables the user to achieve superior imaging performance and resolution. The FE-SEM is designed to reduce malfunction caused by contaminants and other external factors, enhancing overall imaging quality. ZEISS 1530 Scanning Electron Microscope has a magnification range from 10x to 400,000x. It includes an Edmund Type 563 camera that can take digital still images with up to 16 million pixels of resolution. This feature enables detailed analysis of parts of the sample as well as whole surface images. Images can be saved directly to a digital file for later viewing or for further processing. Other features of 1530 SEM include a digital image processor that is capable of carrying out image processing on up to four images simultaneously. It also includes both an electron backscatter diffraction (EBSD) and an auto-focusing, high-angle annular dark field detector (HAADF). Both of these features improve resolution and contrast in images of samples. The SEM also includes a range of vacuum- and environmental-control options that make it suitable for research in a variety of situations. This includes a humidity chamber, heating ranges and control of the pressure and composition of the atmosphere. Together, these features enable the user to precisely control the environment around their sample and observe it under different levels of stress or strain. Overall, LEO / ZEISS 1530 Scanning Electron Microscope is an extremely powerful imaging tool and is an invaluable asset to any research institution. With its wide range of features, it is capable of providing detailed images and analysis of microscopic features in a variety of samples.