Used LEO / ZEISS 1530 #293631668 for sale

LEO / ZEISS 1530 is a fully integrated multifunctional field emission scanning electron microscope (FE-SEM). It is designed to provide high-resolution imaging of particle surfaces and other specimens in both research and industrial fields. This FE-SEM is equipped with the latest technologies such as electron back-scattered diffraction, energy-dispersive X-ray spectroscopy, scanning transmission electron microscopy, electron tomography, and low-voltage microscopy, making it suitable for a wide range of applications. LEO 1530 offers an exceptional combination of high resolution imaging and advanced analytical capabilities. Its high-precision nanoscale performance enables it to provide crisp, high-resolution images of particles, whose sizes range from a few nanometers to several hundred micrometers. An auto-dried liquid nitrogen-cooled electron source provides stable and long-term high-resolution imaging, while an automated secondary and backscattered electron detector (BSED) allows for easy characterization of electron diffraction patterns, grain boundaries, and other sample features. The FE-SEM also features advanced automation capabilities, including an auto-focus feature and an automated sample-handling system that allows for fast and accurate sample positioning. Additionally, a variety of site-specific probes enable users to rapidly acquire data at the nanoscale. ZEISS 1530 offers a variety of analytical capabilities, including energy-dispersive X-ray spectroscopy (EDX), electron energy-loss spectroscopy (EELS), and X-ray photoelectron spectroscopy (XPS). By pairing EDX and EELS with STEM imaging, users are able to analyze the elemental composition, bonding energy, electronic structure, and bond lengths of a sample. The XPS imaging system also offers an additional layer of information, allowing users to investigate the composition, oxidation state, and chemical environment of a sample. 1530 also features an advanced software package, which includes the ability to adjust imaging parameters for optimal analysis, perform automated measurements, and generate different types of microscopy images. Additionally, this software package offers 3D imaging capability, allowing users to analyze sample features from different angles. These features, combined with LEO / ZEISS 1530's excellent performance and high-resolution imaging capabilities make it an ideal tool for a wide range of nanoscale applications.