Used LEO / ZEISS 1530 #9244400 for sale
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ID: 9244400
Vintage: 1999
Field Emission Scanning Electron Microscope (FE-SEM)
Electron source: Schottky field emitter
Resolution:
1 nm @ 20kV (2 mm WD)
3 nm @ 1kV (2 mm WD)
Accelerating voltage: 200 V to 30 kV
Probe current: 4pA to 10nA
Magnification: 20x to 900,000x
E-T Secondary electron detector
High efficiency in-lens electron detector
ROBINSON BSD
IR Chamberscope
Eucentric 5-axis motorized stage:
X: 75 mm
Y: 75 mm
Z: 25 mm
Tilt: -15° to 90°
Rotate: 360°
Does not include EDX
No EDS
1999 vintage.
LEO / ZEISS 1530 is an advanced scanning electron microscope (SEM) that harnesses the power of electrons to visualize and analyze a wide variety of materials and objects in unprecedented detail. Built by the optical giant LEO with engineering from the renowned ZEISS company, LEO 1530 has the sensitivity to image individual atoms and the resolution to uncover microstructures that were hitherto invisible. At the heart of ZEISS 1530 is a 3.5 nm field emission electron gun that is capable of producing both regular electron beams and variable shaped beams (VSB) for higher resolution. This electron gun is equipped with a range of collection devices such as electrostatic lenses, magnetic coils, and waveguides for focusing the beam to a point of just a fewMicrometers in size. This feature gives 1530 an extraordinary level of detail and accuracy when imaging small structures. In addition to the impressive electron gun, LEO / ZEISS 1530 is also equipped with a wide range of analysis and detection systems. These include an advanced energy filter to analyze sample composition and bonding, dedicated detectors for measuring electron-beam induced charging, and a secondary detector for secondary electron imaging. This suite of components opens up exciting possibilities for advanced materials characterization. LEO 1530 also utilizes innovative electron column technologies that provide control over the angle of the beam and reduce the electron scattering. This improves the overall resolution of the instrument and gives it the capability to image smaller and more detailed features such as surface topography. External analysis can be performed with the SEM's x-ray and mass spectrometry systems. These are key components for measuring the chemical composition of samples and ZEISS 1530 is outfitted with an expansive range of detectors to achieve accurate readings. The package is rounded off with an intuitive and easy to use graphical user interface that is designed to take advantage of 1530's impressive imaging and analysis capabilities. This intuitive GUI allows the user to set and adjust a wide variety of parameters, as well as take advantage of automated workflows. Overall, LEO / ZEISS 1530 is an outstanding scanning electron microscope that delivers superb imaging and analysis capabilities for its users. With its advanced electron gun and range of detectors and analysis systems, LEO 1530 offers unparalleled accuracy and resolution when imaging materials and objects. This makes it an ideal instrument for both research and industrial applications where high-resolution is paramount.
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