Used LEO / ZEISS 1530 #9293309 for sale
URL successfully copied!
ID: 9293309
Wafer Size: up to 6"
Vintage: 2011
Field Emission Scanning Electron Microscope (FE-SEM), up to 6"
Detectors: In-Lens, SE, and BSE
Accelerating voltage: 0.2 kV to 30 kV
X / Y / Z Axes motorized stage
2011 vintage.
LEO / ZEISS 1530 is a versatile and high-powered scanning electron microscope (SEM). This model is suitable for a wide range of applications, including biological, materials science, nanotechnology, and semiconductor research. Its core component is an in-lens secondary electron (SE) detector, which provides images featuring exceptional depth of focus, resolution, contrast and sample sensitivity. The detector configuration also allows for the collection of back-scattered electrons (BEs) using a hyperbolic or multiple low-angle detector. LEO 1530 utilizes a cold field electron lens (CFEL) system for improved performance and reliability. It features a maximum accelerating voltage of 30 kV and a spot size of 1.5 nm. The combination of the CFEL system and the in-lens SE detector allows for a significantly increased beam current and improved back-scattered electron image contrast. The microscope is programmed with a comprehensive and easy-to-use graphical user interface, which allows users to intuitively control the microscope and analyze results. ZEISS 1530 is extremely versatile in that it is compatible with a wide range of sample holders and stages. It is capable of accommodating small and delicate samples, including single cells, liquids, and samples that require particular environmental conditions, such as low temperatures and/or pressure. In addition, the instrument is equipped with several automated stages that enable users to reassess areas of interest when operating at high magnification. 1530 also offers a range of features and options that will appeal to a variety of research applications. It is equipped with an X-ray energy-dispersive spectrometer for elemental analysis and a windowless detector that provides higher resolution images. It also offers high-speed imaging, live sample manipulation and monitoring, and pattern recognition software. In conclusion, LEO / ZEISS 1530 is an advanced and reliable SEM that is capable of resolving details down to the nanometric scale. It is designed for users ranging from entry-level researchers to experienced scientists, and its comprehensive range of features bestow it with great versatility.
There are no reviews yet