Used LEO / ZEISS 1550 #293636318 for sale

LEO / ZEISS 1550 Scanning Electron Microscope (SEM) is a versatile instrument equipped with advanced technology used for imaging and analysis. The electron column of LEO 1550 SEM is equipped with a Schottky electron gun, a field emission gun (FEG), and a tungsten composite tip view. It also includes a high-vacuum equipment to keep the electron beam under ultra-high vacuum at operating pressures of 10-8 Pa. This ensures the highest signal yield and optimal image resolution. The optical system of ZEISS 1550 SEM includes a high-resolution scanning transmission electron microscope (S/TEM), a secondary and a backscatter electron detector (BSD), a charged particle detector, and an X-ray detector. The S/TEM mode provides large depth of field, giving it the capability of imaging materials at higher magnifications. In addition to imaging, the unit can also be used to analyze sample elements by energy dispersive X-ray spectroscopy (EDX) or wavelength dispersive X-ray spectroscopy (WDX) providing qualitative and quantitative results. 1550 SEM allow users to perform a wide variety of imaging and analytical tasks. The machine can be used to examine surface topography at high magnifications, submicron features and even nanoscale analysis. It also provides three-dimensional analysis of structures and interfaces, a 3D digital tomographic approach to nanoscale materials, and simultaneous imaging of chemical composition and image contrast - allowing users to easily identify different elements in a sample and accurately analyze their distribution. LEO / ZEISS 1550 SEM also offers advanced hardware support options, including large working chamber temperature, adjustable table-height imaging, automated imaging of large samples, motorized and programmable traverse, and large sample loading capabilities for automated imaging of large numbers of identical pieces. LEO 1550 SEM even includes workflow automation capabilities and software support options, allowing users to access and manage large volumes of data with an efficient and intuitive user interface. To ensure optimal imaging performance and accuracy, the SEM features a fully automated feature recognition (AFR) tool, an imaging effects detection asset, and a stress analysis model. Overall, ZEISS 1550 scanning electron microscope offers comprehensive imaging and analytical capabilities to suite a wide variety of applications. This makes it an ideal equipment for research and development, quality control, and failure analysis.