Used LEO / ZEISS 1560 #9030580 for sale

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ID: 9030580
Vintage: 2004
FE Scanning electron microscope, (SEM) Dedicated chiller Pumps Gemini column technology Operating System: Windows 7 Ultimate, English Software Version: Smart SEM v05.05 Facilities Requirements Power: 230 -15% + 10%, 50/50 Hz, 1 Ph Consumption: 3 to 5 KVA Cooling water: 2 L/min at 2 Bar, 18°-22°C ± 0.5°C Compressed nitrogen: 2 L/min at 0.2 Bar Nitrogen quality: 4.6, >99.996% Nitrogen content Compressed Air: 6 Bar Environmental Requirements Ambient temperature: ~22°C ± 5°C, ±1°C stability Relative humidity: < 65% Floor vibration: Less than 2 um/sec for < 15 Hz, Less than 20 um/sex for > 15 Hz Magnetic stray fields: Less than 3 mG peak to peak at 50/60 Hz Acoustic noise: Less than 55 dBA for > 100 Hz, Less than 40 dBA for < 100 Hz Currently installed 2004 vintage.
LEO / ZEISS 1560 scanning electron microscope is a high-performance analytical and imaging instrument. It combines excellent resolution with ease of use, allowing users to obtain precise, high-contrast images of small and intricate samples. The microscope features a digital signal-processing and image-capture equipment, combining a high-performance electron gun, high-resolution objective lenses, a special secondary electron detector and a digital image processor. The electron optics of LEO 1560 provide the highest resolution and image definition, allowing the study of nano-scale features with excellent details and contrast. By utilizing an advanced control system, users of ZEISS 1560 have access to a suite of advanced features and functions, including variable beam current, voltage and spot size, higher magnifications up to 500,000x, analytical tools such as EDS and EDX, and a range of digital image processing options. Furthermore, the flexibility of the scanning electron unit allows for improved imaging of both insulating and conductive samples without the need for additional stages and accessories, while oversized stage movements make it easier to position samples for optimal imaging. 1560 also features an ergonomic design, with intuitive controls and a built-in computer machine, together with an extensive range of supporting software, allowing for differing user interfaces and ease of access. All of this is coupled with a comprehensive tool for image storage, providing automatic annotation and quality control. Overall, LEO / ZEISS 1560 is an excellent tool for a wide range of imaging and analytical applications, from defect analysis and failure analysis to materials characterization and quality control. It combines high resolution with ease of use, allowing users to produce high-contrast images of intricate samples and study nano-scale features with detail.
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