Used LEO / ZEISS 1560 #9067762 for sale

LEO / ZEISS 1560 scanning electron microscope (SEM) is an advanced microscope equipment for analyzing material surfaces and sub-surface structures in great detail. The fully integrated, turn-key system offers cutting-edge features such as high-quality Secondary Electron (SE) imaging, Energy Dispersive X-Ray Spectroscopy (EDS) for elemental mapping and analysis, and automated focused ion beam (FIB) capabilities. LEO 1560 features an SE detector, multi-order EDXS detector and ESI Tomography detector. The SE detector is a secondary electron detector that offers various resolutions and large imaging scales for a wide selection of applications. The EDXS detector allows the user to perform elemental analyses on a range of materials by viewing their distribution and relative abundance. The ESI Tomography detector provides tomographic reconstructions of samples in three dimensions thus allowing users to gain a better understanding of sample structures. ZEISS 1560 features an automated ion-beam column, enabling users to cross-section and etch samples. The column includes an oscillating impact wire that allows for precision etching and incision in even the most critical samples. The ion gun also offers high-resolution imaging by allowing multiple layers of material to be imaged with ease. 1560 includes a digital image platform providing a suite of powerful software tools to analyze and organize results, including fast image segmentation. This package also includes a particle size analysis and particle averaging tool for advanced application analysis. LEO / ZEISS 1560 SEM utilizes a fully enclosed vacuum unit with a variety of optional sample preparation accessories for optimal imaging performance. The high-performance illumination machine offers high brightness, wide field of view, and superior image detail while the advanced sample positioning stage provides precision movement for enhanced sample study. Finally, LEO 1560 SEM is compatible with a variety of imaging and analysis accessories which can be easily added to increase its functionality. ZEISS 1560 SEM is a robust and reliable tool that offers advanced features and powerful functionality for a variety of application requirements. It provides an extensive range of automation and mobility, allowing users to quickly and accurately collect data and results. This high-performance scanning electron microscope is an invaluable research tool for laboratories around the world.