Used LEO / ZEISS 1560 #9069353 for sale

LEO / ZEISS 1560 scanning electron microscope (SEM) provides high-quality imaging of a variety of samples, making it ideal for both research and industrial applications. It is powered by a patented in-column field emission gun (FEG), and has a powerful high-resolution detector that can capture images of up to 72 megapixels. The system is designed to provide a large depth of field and excellent signal-to-noise ratios, enabling researchers to study ultra-fine microstructures in a variety of materials with high magnification. LEO 1560 SEM is equipped with a wide variety of features, including a unique auto-focus feature that allows users to easily focus on a region of interest for highly detailed analysis. In addition, the SEM is able to detect electrons from a variety of angles, providing dynamic imaging capabilities. This allows for large-scale mapping of small features and structures, meaning that the microscope can be used to perform complex 3D analyses that would otherwise be time consuming and difficult to achieve with other microscopes. The SEM also has a powerful Low Vacuum Mode that can be used to observe live samples without the need for a vacuum chamber, making it ideal for viewing biological samples and samples in their native environment. Additionally, the SEM provides an unbeatable collection of advanced microscope automation tools that helps to reduce operator reliance on manual data acquisition techniques. For example, the microscope can automatically perform multiple tasks, such as sample scanning, stage motion, and image processing. Finally, the SEM also comes with the unique ability to produce a light sheet for direct observation of a sample, helping to maximize contrast and resolution in the final imaging results. ZEISS 1560 is a powerful SEM that provides high-resolution imaging and analysis of a variety of samples, making it suitable for a wide range of research and industrial applications. It is equipped with a wide variety of features to make imaging and analysis easier and faster, and provides unbeatable levels of automation and operator control.