Used LEO / ZEISS 1560 #9272757 for sale

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ID: 9272757
Vintage: 1998
Field Emission Scanning Electron Microscope (FE-SEM) Uniplinth upgraded Operating system: Windows 7 Does not include: EDX Evactron 1998 vintage.
LEO / ZEISS 1560 Scanning Electron Microscope (SEM) is a versatile and reliable tool that allows users to observe and analyze samples with high magnifications of up to 250,000x. It is a high-performance, low-voltage SEM that features an on-axis system with excellent depth of field and resolution, making it the tool of choice for many researchers and technicians. LEO 1560 SEM features a Schottky field emission gun, providing a modern solution to electron optics and improved signal-to-noise ratios. It has a variable spot size of 0.2 to 10 µm2 for high-resolution imaging and analysis. This SEM also offers an Everhard-Thornley multi-segmented secondary electron detector for accurate elemental analysis. Additionally, ZEISS 1560 has an integrated chamber for sputter coating, and the gun can be fitted with a 2mm backscatter detector, enabling it to perform a variety of imaging and detectors modes. For imaging, 1560 SEM can use various techniques to explore specimen surfaces and features. These include secondary electron imaging, phase-contrast imaging, backscatter electron imaging, manual and automated tilt imaging, stigmation and dark-field imaging, and energy dispersive X-ray mapping. Furthermore, the precision of this SEM allows for 3D imaging with topographic, line profiles, particle analysis, and automated surface measurements. LEO / ZEISS 1560 SEM also offers increased flexibility for experiment design. It has a digital joystick, allowing for manual specimen navigation while observing live SEM images. Additionally, an optional scanning stage can be added, allowing for automated scanning and recording in several modes. It also allows for various tilt angles, making it perfect for cross-sectional investigations. Finally, LEO 1560 SEM offers a user-friendly control interface with several operational features and capabilities. It is equipped with an Autofocus program, a preset library with a number of parameters, an angle measurement system and an automated recovery system. This ensures that the SEM can remain safe and reliable during operation. All of these features make ZEISS 1560 SEM an invaluable tool for obtaining detailed and accurate images and data for a range of research and industrial needs.
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