Used LEO / ZEISS 430i #9407378 for sale

LEO / ZEISS 430i Scanning Electron Microscope (SEM) is a high performance, dual beam FIB/SEM imaging equipment. Combining industry leading resolution and the ability to both image and manipulate nanoscale structures, LEO 430i SEM facilitates a wide range of materials analysis applications. It features a high-definition column for imaging capabilities down to a resolution of 1 nanometer, and its advanced high-powered cathode/anode dual beam system enables multi-mode operation for advanced characterization and manipulation of very small objects. The SEM column is designed to facilitate high resolution imaging while still providing the flexibility required to work with a variety of sample sizes and types. ZEISS 430i is equipped with a secondary electron (SE) detector, a back scattered electron (BSE) detector and a chemical analysis detector with a field-emission gun allowing for rapid imaging. A gas injection unit (GIS) is included, allowing for the introduction of functional gases during imaging and manipulation as needed. The multi-mode operation of 430i is enabled by its Variable Pressure/Low Vacuum (VP/LV) configuration. This allows for advanced characterization of hard-to-image materials where the environment can be manipulated to enable high-resolution imaging. The LV mode provides a low-energy environment for imaging particulates, slow-draining films or films with thicker cross-sections that would require a larger electron dose in a higher vacuum. LEO / ZEISS 430i comes with a 360-degree rotation stage and a 6-axis sample stage with in-plane and out-of-plane manipulation that allows for easy imaging and manipulation of specific regions of interest. Additionally, it comes with a variety of control modes such as auto focus, auto stigmation and auto exposure, providing users with complete control over the imaging environment. LEO 430i can be integrated with a variety of automated sample handling systems for even greater flexibility. In summary, LEO 430iScanning Electron Microscope is a powerful, dual beam FIB/SEM imaging machine capable of providing high-resolution imaging and manipulation of nanoscale objects. Its sophisticated column and GIS tool allow for manipulation of the imaging environment for a variety of materials, while its control modes and automated sample handling systems provide users with the flexibility needed for any analytical application.