Used LEO / ZEISS 435VP #9255854 for sale

LEO / ZEISS 435VP scanning electron microscope is a high performance instrument designed to offer superior imaging capabilities and analytical performance. It is especially well suited for imaging and analysis of nanoscale structure resolution. This microscope utilizes a field emission electron source that has been designed to offer improved electron brightness, greater transmission values and significant column lifetime. As a result, the microscope offers an impressive resolution of up to 10 nm at high probe current levels. The specimen can be placed on a sample holder insert which allows for specimen manipulation. Orientation during analysis is provided by an automated 6-axis motorized stage and intricate movements can be achieved with high resolution piezo motion. The stage is capable of moving the specimen both in a linear or rotation about the vertical axis, horzontal axis or a third axis defined by the normal direction. Users of the system can make use of a variety of detectors to capture images. The transmitted electron detector can capture images in both the backscattered and secondary electrons to achieve contrast from both the surface and volume of the sample. Backscattered electrons can also be observed with a secondary electron detector. These features are supplemented by STEM detectors for bright or dark field imaging or a combination of both. The microscope is further equipped with an automated digital imaging system and auto alignment capabilities. This facilitates imaging documentation with the included integrated camera and the creation of montage film loops. The system also has adjustable scan speed ranging up to 500 Hz, giving the user the option to simulate optical microscopic structure resolution. For analytical capabilities, the microscope utilizes an Energy Dispersive X-ray Spectrometer (EDS) for elemental analysis, allowing the user to identify the chemical composition or thickness of various features on the sample. The combination of the high-contrast imaging and advanced capabilities of LEO 435VP scanning electron microscope makes it an invaluable tool for nanoscale research and analysis.