Used LEO / ZEISS EVO 50 XVP #9314220 for sale
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ID: 9314220
Vintage: 2003
Scanning Electron Microscope (SEM)
Filament: Tungsten
Acceleration voltage: 0.2 - 30 kV
Magnification: 7x - 300000x (Can be higher)
XVP Pressure range: 5 - 750 Pa with air
X-Ray analysis: 8.5 mm AWD and 35° take-off angle
Oven programmed up to 1000°C
FISON Gold coater
Detectors:
NORAN EDX
SE in HV: Everhart-Thornley
SE in XVP: VPSE
BSD
Low vacuum SE and BSE
Opti beam modes:
Resolution
Depth
Analysis
Large field
5-Axes motorized specimen stage:
X: 80 mm
Y: 80 mm
Z: 35 mm
T: 0 - 90°
R: 360° Continuous
Image processing resolution: Up to 3072 x 2304 pixel
Rotary pump
Turbo pump
Operating system: Windows XP
Power supply: 100-240 V, Single phase, 50/60 Hz
2003 vintage.
LEO / ZEISS EVO 50 XVP is a versatile scanning electron microscope (SEM) with an optimized design for performance and productivity. It offers an optimized scanning field, improved resolution, and unrivaled versatility. This scanning electron microscope has an advanced analytical capabilities with attributes such as secondary and backscatter detectors, and energy dispersive X-ray spectroscopy (EDS). The EDX option allows for detection and quantification of trace elements in samples, offering a high-resolution elemental mapping capability to visualize and analyze on a deeper level of detail. LEO EVO 50 XVP is an environmental scanning electron microscope. It offers an advanced research environment with features such as variable pressure control and from high to ultra low vacuum conditions providing superior imaging and specimen analysis. It has a high hydrospeed specimen automation system which allows for precise manipulation and transfer of samples from the load lock into the main chamber. The microscope offers sub-nanometer resolution and a wide range of imaging and analysis. It is especially useful in applications such as failure analysis, material research, and medical diagnostics. The high resolution color CCD camera enables live or recorded images at various magnifications, enabling users to accurately monitor processes in-situ. ZEISS EVO 50 XVP can be used in a variety of settings and provides users with multiple imaging modes including brightfield, darkfield, differential interference contrast, and high-resolution backscattered electron imaging. In addition, it offers low-vacuum operation allowing for examination of smaller samples without the need of sample preparation. The microscope also offers a wide range of sample holders for a variety of applications, including liquid cells, stages for PC boards inspection and cryogenic stages. With its advanced high-performance optics EVO 50 XVP provides high levels of image quality. Overall, LEO / ZEISS EVO 50 XVP is an advanced, reliable, and versatile scanning electron microscope. It offers excellent image resolution, multiple analysis functions, and automated sample handling making it an ideal tool for scientist explorations in a variety of scientific and research fields.
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