Used LEO / ZEISS Gemini 1550 #9213551 for sale

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ID: 9213551
Scanning electron microscope (SEM) Schottky FE-SEM with AMETEK EDAX fixture Detecting unit Joystick controllers HASKRIS Chiller EDWARDS Vacuum pump (2) Computer systems (5) Small parts & bins (2) Lab benches.
LEO / ZEISS Gemini 1550 is a world-leading scanning electron microscope (SEM) system. This instrument provides the highest resolution and highest quality imaging in both reflection and scanning electron modes. It uses a powerful primary electron beam to generate a range of topographies, images, elemental maps, and spectra that accurately capture the properties of the sample under study. LEO Gemini 1550 is configured with Incident Wavevector Analysis (IWA) technology, improved sample stage, and several imaging modes, making it the ideal instrument choice for many semiconductor, materials science and electron metallurgy applications. It combines several advanced technologies including four-axis scan control for high precisions, variable illumination and variable color contrast in the same frame. The instrument is equipped with an ion gun for thin specimen, a low vacuum mode for non-conductive samples, and variable polarization for analyzing crystalline and polycrystalline samples. Moreover, the system offers a range of functions including auto-focus feature, scan modes, EDS mapping with automatic focusing, high accuracy and surface mapping. Its advanced digital image processing and real-time data acquisition optimize the image quality and provide real-time analysis of images. Additional offering include in-situ time lapse and microstructure measurements to efficiently characterize the sample. Moreover, the instrument comes with a range of peripheral devices to facilitate sample preparation, such as an Electron Beam Lithography System, a Leptucopia Automatic Sample Changer/Loader, and an Ion Source. Overall, ZEISS Gemini 1550 is a powerful instrument suitable for many advanced electron microscopy applications. It combines versatility, high resolution, flexibility, and ease of use with its advanced features and wide-ranging peripheral devices. These features ensure the highest accuracy in both mechanical and electron microscopy modes.
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