Used LEO / ZEISS Supra 40P #293644038 for sale
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ID: 293644038
Scanning Electron Microscope (SEM)
Water cooling system:
Coolant flow rate: 1.3 l/min
Coolant temperature: 20°C
Compressed air pressure: 8 bar
Gas pressure: 3500 mbar
Damping / Anti-vibration system
Gauges
Column chamber valve
Turbo isolation valve
Vacuum:
Specimen chamber vacuum pressure: 1.03E^-6 mbar
UHV Chamber vacuum pressure: 2.2E^-10 mbar
Scroll pump
Turbo pump
Control panel / Dual joystick
Touch alarm
Stage drift
InLens Detector
SE Detector
4QBS Detector
VPSE Detector
CCD Camera
Cathode head
FE Cathode
Filament heating and extractor currents:
Filament age: 18051.84 Hours
Extractor voltage at 0.2 mA/sr: 4.3 V
Total current at 0.2 mA/sr: 394 µA
Extractor current at 10 kV: 389 µA
Specimen current: 190 µA
Beam shift:
Standard shift: ±7.5 µm
Width: 8.5 mm
Acceleration voltage: 20 kV
Scan rotation: 360°C
Dynamic focus and tilt angle correction
Beam blanking
PC
Operating system: Windows XP.
LEO / ZEISS Supra 40P is a scanning electron microscope (SEM) designed for research and industrial applications. It combines remarkable versatility, convenient features, and advanced technology to achieve sharp imaging, high uniformed surface resolution, and reliable results. LEO Supra 40P offers a range of features for both 2D and 3D imaging, using a "Zero-Dimple" field emission gun and a 30 W Everhart-Thornley SE detector. It has an advanced energy filter operated with a motorized lift system and digital controls. The system is designed with an ergonomic sample size range and a new titanium-coated column for maximum stability. ZEISS Supra 40P exhibits impressive resolution of up to 1.6nm with advanced digital filter technology. This software-integrated feature enhances microscope's capacity to image the finest details on the sample surface with accuracy and clarity. A new energy filter allows the user to select from 12 different elements and the software-integrated imaging processes the signals from the electron gun to ensure an optimally consistent imaging field. The advanced Everhart-Thornley secondary electron detector provides highly detailed 3D imaging of even nanometer-scale structures. This detector also works with the energy filter to simulate bright-field imaging and allows users to see through even the darkest materials. This also lowers the risk of imaging artifacts and reduces the need for costly sample preparation. Supra 40P also includes several other automated features, including a low-vibration sample handling system, remote imaging processing, and even a rugged manipulator. Its impressive imaging capacity and comprehensive features make it ideal for a variety of applications. It is reliable, efficient, and provides consistent results.
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