Used LEO / ZEISS Supra 40VP #293636806 for sale
It looks like this item has already been sold. Check similar products below or contact us and our experienced team will find it for you.
Tap to zoom
Sold
ID: 293636806
Scanning Electron Microscope (SEM)
Schottky Field Emission
EDAX
Everhart-Thornley (Hi-Vacuum) Secondary electron detector
OXFORD Electron diffraction
Resolution: 1 nm at 20 keV
Backscatter detector: 4-Quadrant
Variable Pressure Secondary Electron Detector
Oil-free rotary pump
Turbo
(2) Ion getters
OXFORD X-Max 80 mm2 SDD EDS
EBSD Oxford/Nordlys HKL
9-Pin
Wafer section
Multipurpose variable clamp
Thin section
1" Metallurgical holder
HASKRIS Air-cooled
Gas requirements: Nitrogen, Compressed air
Operating system: Windows 7
Power requirements: 220V.
LEO / ZEISS Supra 40VP is a scanning electron microscope (SEM) designed for ultra-high resolution imaging of a variety of samples. It features a variable pressure column with a working distance of up to 14 mm and an Everfab Source of 120 cm². Its Philips X'Pert Pro platform is a powerful and reliable platform capable of probing the microstructure of objects at magnifications of up to 200,000x. LEO Supra 40VP is equipped with several components that contribute to its superior resolution and image clarity at high magnifications. One of its most important components is the Everfab Source, which is equipped with a gamma-corrected electron beam and a multi-segmented CCD detector. This combination of advanced optics allows for sample resolution of better than 0.6 nm. Another important component of the equipment is the EDAX Genesis spectrometer, which can be used to detect and analyze the composition of samples without damaging them. In addition to its exceptional imaging capabilities, theSupra 40VP also features a range of features designed to facilitate its use. This includes a patented noise suppression technique, an intuitive touchscreen interface, and automated alignment, calibration, and referencing processes. The system also offers powerful imaging and analysis tools such as electron backscatter diffraction (EBSD) and energy dispersive spectrometry (EDS). EBSD allows for the identification and analysis of crystalline phases in samples and EDS provides qualitative and quantitative composition analysis of all elements in the periodic table. ZEISS Supra 40VP is also equipped with an automatic sample preparation unit, which consists of an automated vacuum evaporator and an automated sputter coater. This machine enables users to uniformly prepare samples for imaging and analysis. Overall, Supra 40VP is a versatile and powerful scanning electron microscope specifically designed for high-resolution imaging and analysis of a variety of samples. Its high-quality components and automated processes enable users to quickly and accurately analyze samples with unprecedented detail.
There are no reviews yet