Used LEO / ZEISS Supra 40VP #293660495 for sale

LEO / ZEISS Supra 40VP is a scanning electron microscope (SEM) designed for intuitive use, robust performance, and unsurpassed image quality. It has a number of characteristics which make it uniquely useful for advanced imaging applications. At the heart of the system is a highly efficient, large-area field emission gun (FEG) electron source, which is just a few of nanometers in size and allows for high resolution imaging. This gun is able to provide a consistently uniform electron beam with a brightness of up to 131 A/cm2-sr. LEO Supra 40VP has been designed with automated operation in mind. Its platform includes an intelligent control system that is designed to provide optimum alignment and magnification, and to suggest optimal settings for specific imaging tasks. It also features a touchscreen interface with which users can easily and quickly set parameters and adjust settings for their imaging task. ZEISS Supra 40VP also has a wide range of detectors for both imaging and analytical applications. Its high resolution BSE (backscattered electron) detector helps to produce crisp images for material identification and quality control. It also has special detectors for X-ray and diffraction, enabling advanced materials analysis. Supra 40VP is also highly versatile, offering flexibility in the types of samples that can be analyzed. It is capable of imaging anything from thin films to large, translucent specimens. It can also be used for a wide range of imaging techniques, including electron transparent imaging and atomic level imaging. In conclusion, LEO / ZEISS Supra 40VP is an advanced scanning electron microscope with powerful imaging capabilities and versatility. With its large area field emission gun, intelligent control system, and wide range of detectors, it is the perfect choice for imaging and analyzing a variety of samples.