Used LEO / ZEISS Supra 50VP #9361523 for sale

LEO / ZEISS Supra 50VP scanning electron microscope (SEM) is a powerful imaging tool that enables users to study the surface topography and composition of a wide variety of micro-scale specimens. Its capabilities include high-resolution images of surfaces, thin films, and nanostructures. The SEM is an air-sensitive electron microscope that utilizes secondary electrons and/or backscattered electrons emitted from a specimen when irradiated with an electron beam to create 20 nm resolution images. The primary source of the electrons can either be a heated filament or a field emission source. In addition to ultra-high resolution imaging, the SEM is capable of performing qualitative and quantitative energy-dispersive X-ray spectroscopy, which can chemical elemental composition of a tested specimens. LEO Supra 50VP SEM comes with a variety of features, including a fully digital auto-focusing equipment, low electron beam voltages for improved imaging of sensitive samples, and a high-speed detector system for continuous imaging of large specimen surfaces. Other features include motorized sample stages, laser pulse-based auto-alignment, and automated data acquisition for whole specimen analysis. The upstream stages of the SEM, which normally include a gun assembly, vacuum unit and beam blanking/shading machine, can be tailored to individual user needs. In addition, the critical backscattered detector can be swapped out for detectors specifically designed for different types of imaging, such as scanning transmission electron microscopy. ZEISS Supra 50VP is an advanced, user friendly instrument that scientists and engineers have relied on for years to gain detailed insight into the structure and composition of a wide range of surfaces. With its high-resolution imaging capabilities and energy-dispersive X-ray spectroscopy, Supra 50VP is an invaluable tool for research and development into micro and nanostructures.