Used LIETZ SOKKISHA MS-27 #293587439 for sale

LIETZ SOKKISHA MS-27 is a scanning electron microscope (SEM) that can be used for a variety of analytical techniques. This system is designed to give increased control of electron beam width, current intensity, resolutions and magnifications. With a maximum magnification of 50,000 times, the SEM is capable of resolving details as small as 0.1 nanometers. The SEM is an ideal tool for surface analysis, as it enables users to collect images and data providing fundamental information on imaging and measuring the topography, composition and physical characteristics of a sample. It is an excellent choice for examining conductive or non-conductive materials, ranging from very large samples to nanoscale objects. MS-27 SEM is equipped with a variable pressure secondary electron detector that is used to measure the reactions of the sample in the electron beam environment. This allows users to acquire higher resolution imaging at much lower electron current levels, reducing the possibility of sample damage. Furthermore, the SEM is fitted with a high-resolution wall-coating unit designed to ensure high vacuum performance and minimize particle contamination. Additional features of LIETZ SOKKISHA MS-27 SEM include an automated multi-parameter image acquisition, a motorized X-Y scan system and a 4-axis objective lens holder that can be fine-tuned using an integrated joystick. The SEM also comes with a measurement package designed to accurately measure areas and distances with up to 16x16x400 samples in 1D, 2D and 3D mode. The measurement package provides an easy-to-use interface to quickly measure samples and review image analysis data. In conclusion, MS-27 scanning electron microscope is an excellent choice for researchers and engineers looking to analyze objects ranging from the large scale to the nanoscale. Its precise and automated control systems enable users to accurately observe the physical characteristics and compositions of samples, while the measurement package allows them to quickly and easily review image analysis data and measure areas and distances.