Used NGR 3520 #9313577 for sale

NGR 3520 is a scanning electron microscope (SEM) specifically designed for the purpose of imaging sample surfaces from the micron to nanometer levels. It is equipped with a 20kV Schottky field emission electron source, an orthogonal sample holders and a fully digital imaging system for high precision, high-resolution operation. The electron gun of 3520 is a point source that is positioned near the middle of the lamp housing. This ensures high yields of electrons with high energy and very short distances between the gun and the specimen being scanned. The field of view is approximately 5-20mm, while the total working distance between the gun and the sample is adjustable up to 10mm to accommodate various sample sizes and shapes. This allows for a wide range of magnification and operating conditions. The objective lens of NGR 3520 is a tilting high-angle Schottky field-emission condenser. This design allows for a wide range of working distance to accommodate various sample sizes and shapes. The built in specimen holder allows for precision sample navigation and positioning with an accuracy of 5 arc seconds in all directions. The imaging system of 3520 consists of a blanking gun and an electron lateral deflector, as well as a frequency-doubling detection system. The blanking gun controls the electron beam so that it can be precisely and accurately focused, and the lateral deflector makes compensation for any distortion or drift of the electron spot in the image path. This results in a clear and sharp image that is suitable for both surface analysis and imaging. When using NGR 3520, samples can be analysed in high resolution in both SEM and in backscattered electron imaging. This allows for accurate imaging of the sample's surface features and composition information. Additionally, the electron source can be used to stimulate secondary electron production for visualising the surface topography. Controllable environmental conditions are available in 3520 for characterising samples that are sensitive to external factors, such as humidity and gas. This instrument is also capable of performing low temperature investigations, providing high resolution imaging at temperatures down to -172°C. In summary, NGR 3520 is a powerful scanning electron microscope that offers high resolution images, precision specimen navigation, adjustable working distance and environmental control features. It is suitable for a variety of research applications that require detailed or quantitative analysis of surface features and composition on both macro and micro scales.