Used NUTEK NTM600 SC #9219954 for sale

NUTEK NTM600 SC scanning electron microscope (SEM) is a versatile and sophisticated microscope used to conduct microscopy on samples at the atomic level. It has a high voltage electron gun that can produce a high intensity beam of electrons that can penetrate a specimen and produce an image that is magnified up to 600,000 times. The SEM offers a large variety of functions for imaging and analysis, including ultra-high resolution imaging, fast image capturing, automated measurements, and more. It is equipped with a high brightness source filament to generate intense electron beams for imaging. This microscope is great for capturing images of samples made from a wide variety of materials, including metal, plastic, wood, and more. The high resolution imaging capability of the SEM allows researchers to gain insight into the nanoscale structure of their samples. The instrument's powerful imaging lens enables images with the exact detail necessary to inspect specimen features. The SEM can also be used to acquire three-dimensional images of the sample with unprecedented clarity. NTM600 SC has a user-friendly interface that makes it easy to control the microscope for optimal performance. The software features a variety of advanced parameters, such as beam tunes, detect settings, manipulate view, focus and tilt correction, spot size selection, magnification adjustment, and scanning mode options. The microscope also features a high-resolution imaging equipment and low noise performance. The SEM comes with an integrated computer system that enables users to control the microscope via its integrated Graphical User Interface (GUI). The unit features an intuitive navigation through the microscope's various menu structures to access the various imaging acquisitions and operations. Additionally, the machine is equipped with advanced software that allows for comprehensive data analysis. In conclusion, NUTEK NTM600 SC is an advanced and powerful microscope for researchers and scientists. Its features enable them to obtain high-resolution images of the sample with unprecedented clarity. Its user-friendly interface and powerful imaging capabilities make it a great choice for those who need to inspect and analyze specimen features at the nanoscale.