Used OKOS VUE 400 #9282777 for sale

OKOS VUE 400 is a scanning electron microscope (SEM) created by OKOS Technologies. This equipment is designed for research and industrial analysis applications, and is capable of providing high-resolution imaging for the examination of objects at the sub-micron level. VUE 400 is equipped with a highly sensitive secondary and backscater electron imaging source, which enables optimum imaging performance. It is enhanced with a light source for more advanced applications such as various types of optical imaging, including cathodoluminescence, photoluminescence, and reflectance spectroscopy. OKOS VUE 400 is also equipped with a focused ion beam (FIB) column, allowing detailed surface studies of materials, and a dynamic angle detector for precise angular resolution. This imaging system also includes an automated sample stage, allowing for various objects to be imaged in a variety of orientations. VUE 400 has a wide range of features designed to enable the user to acquire high-resolution images of various objects. These functions include automated object alignment, an automated Z-axis scanning unit, and a variable spot size for precise control of the imaging parameters. It is also designed with a highly durable mechanical structure for long-term reliability and performance, with several user-friendly functions such as voice control and joystick navigation. This machine also incorporates several safety features such as electron gun protection, manual interlock, and an emergency shut off switch. OKOS VUE 400 is a powerful, reliable imaging tool capable of accurately capturing the details of objects at the nano-scale level. Its versatile and superior imaging capabilities make it a tool of choice for many researchers and industrial engineers looking for high-resolution imaging applications.