Used PARK SYSTEMS XE-300 #9221612 for sale

PARK SYSTEMS XE-300
ID: 9221612
Microscope.
PARK SYSTEMS XE-300 is a state of the art scanning electron microscope (SEM) that provides advanced capability to capture high resolution images of nanoscale structures with a resolution down to 0.75nm. XE-300 utilizes an Everhardt-Thornley Variable Pressure System (VPS) to provide optimized specimen chamber control for operation in both high vacuum and low vacuum modes. PARK SYSTEMS XE-300 employs a cutting-edge column design with a two-stage gun, consisting of an in-lens gun and a tungsten filament electron gun. This dual guns allow XE-300 to capture ultra-high resolution images even under high magnifications. Additionally, the in-lens gun allows for faster imaging speed up to 3200x line rate. PARK SYSTEMS XE-300 also utilizes an optimized Cs-corrector system to reduce spherical aberration and maximize image contrast. XE-300 also offers a wide range of analytical capabilities for characterizing nanomaterials. With the Energy Dispersive X-ray Spectrometer (EDS), users are able to perform elemental analysis and identify material composition. Additionally, PARK SYSTEMS XE-300 is equipped with an X-Ray Auger Spectrometer (XAES) and a Wavelength Dispersive X-ray Spectrometer (WDS), which can be used to measure chemical composition of materials. With the optional Electron Backscatter Diffraction (EBSD) unit, users can also perform crystallographic measurements and analyze crystalline structure. XE-300 packs a range of features that enable users to accurately control and automate the imaging and analysis processes. This includes an intuitive user interface for quick set up, a six-input sample holder for reversely mounting samples, and advanced stage motion control for precise scanning. With the PC-controlled detector optics, users can control detector presence in the SEM image, providing greater image clarity and contrast. Overall, PARK SYSTEMS XE-300 is an advanced scanning electron microscope that is perfect for capturing ultra-high resolution images of nanoscale structures. With a variety of analytical capabilities and advanced automation features, XE-300 offers unmatched capability for the study of nanomaterials.
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