Used PARK SYSTEMS XE-70 #9225309 for sale
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ID: 9225309
Atomic Force Microscope (AFM)
XY Scanner:
Single-module flexure with closed-loop control
UV LED Head has been replaced
Computer with (2) monitors
Controller
Light source
Scan range:
100 μm x 100 μm
50 μm x 50 μm
10 μm x 10 μm
Manual stage:
XY Travel range: 13 x 13 mm
Z Travel range: 29.5 mm
Focus travel range: 70 mm
Z Scanner range:
Guided high-force Z scanner
Scan range: 12 µm, 15 µm
Sample mount:
Sample size: Up to 100 mm
Thickness: Up to 20 mm
Direct on-axis vision of sample surface and cantilever
Coupled with 10x objective lens
Field-of-view: 480 x 360 µm
CCD: Mpixel
Electronics:
DSP: 600 MHz with 4800 MIPS
Maximum 16 data images
Maximum data size: 4096 x 4096 Pixels
Signal inputs: 20 Channels of 16 bit ADC at 500 kHz samplings
Signal outputs: 21 Channels of 16 bit DAC at 500 kHz settling
Synchronous signal:
End-of-image
End-of-line
End-of-pixel TTL signals
Includes:
ACOUSTIC Enclosure
MINUS K TECHNOLOGIES Platform
Power: 120 W
CE Marked.
PARK SYSTEMS XE-70 is an advanced scanning electron microscope (SEM) designed to meet the needs of researchers in diverse fields such as nanotechnology and materials science. XE-70 offers unique dynamic imaging capabilities, making it an ideal choice for high-resolution imaging, surface characterization, and three-dimensional analysis. PARK SYSTEMS XE-70 features a large, highly sensitive 12 megapixel digital camera and a broadband energy detector to capture images at resolutions up to 1 nanometer. Its high-voltage electron source is capable of producing beams from 0.5 to 100keV and offers a wide range of analytical techniques, including electron backscatter diffraction, secondary electron imaging, and X-ray microanalysis. XE-70 also offers a wide range of sample stages for accommodating many different sizes and shapes of specimens. PARK SYSTEMS XE-70 boasts a number of enhancemens that make it an ideal choice for conducting sophisticated research. Its environmental control system maintains stable vacuum levels during operations and minimizes interference from environmental vibrations, making it perfect for high-resolution imaging. XE-70 also features a user-friendly digital interface, making it easy to operate the microscope and manipulate its settings. In addition, its integrated image processing software makes it easy to process data and create high-quality images. Overall, PARK SYSTEMS XE-70 is a powerful and versatile scanning electron microscope that offers unparalleled performance and flexibility. With its ability to capture high-resolution images and wide range of analytical capabilities, it is an ideal choice for researchers in diverse fields.
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